美国Gatan公司潘明博士访问微纳尺度材料研究中心,将做精彩报告
学术报告
美国Gatan公司潘明博士将于6月14号访问微纳尺度材料研究中心。届时将做精彩报告。
报告时间:6月14日(周二)下午3:00
报告地点:材料学院/金属材料强度国家重点实验室215会议室
报告题目:
New product development for (nano) materials characterization
报告人简介:
Dr. Ming Pan is the Vice President of Business Development at Gatan, Inc. His electron microscopy career started with Prof. K.H. Kuo (1982) in the Institute of Metal Research, Chinese Academy of Sciences in Shenyang. In 1984, he joined Prof. J.M. Cowley’s group at Arizona State University, and received the Ph.D. degree in 1990.From 1990-1994, he was a research scientist in the Center for High Resolution Electron Microscopy (now the J.M. Cowley Center for HREM) at ASU. He pioneered the development of experimental technique for imaging beam sensitive materials such as molecular sieves at high spatial resolution with CCD cameras. In 1995 he joined Gatan and held various positions.